- ISO
Class 3–5 (very stringent)
- Used
in photolithography, etching, and wafer patterning, where
particles as small as 0.1 microns can cause defects.
- For
example, Intel, TSMC, and Samsung fabs often operate at ISO Class
4 or better in critical areas.
- ISO
Class 6–7
- Used
in less particle-sensitive zones, such as wafer cleaning,
coating, and non-critical assembly.
- These
areas still maintain strict controls but allow slightly higher particle
counts.
- ISO
Class 8–9
- Applied
in support and gowning areas where operators prepare
before entering higher-grade zones.
GMP and Federal
Standards
Before ISO 14644,
cleanrooms in semiconductor fabs often followed the older US Federal
Standard 209E:
- Class
1 and Class 10 (≈ ISO Class 3–4) were
used in wafer fabrication lines.
- Class
100 or Class 1000 (≈
ISO Class 5–6) were applied in secondary processing steps.
Even though FS 209E
was retired in 2001, the terminology (Class 10, Class 100, etc.) is still
widely used in the semiconductor industry.
Practical Example
- Photolithography
area: ISO Class 3–4 (Class 1–10
FS209E)
- Wafer
cleaning & etching: ISO
Class 4–5
- Assembly
& packaging: ISO Class 6–7
- Gowning
area: ISO Class 8
This tiered system
balances cost vs. contamination control, since maintaining an ISO
Class 3 environment across an entire fab would be prohibitively expensive.
Conclusion
In summary, semiconductor
manufacturing requires ISO Class 3–5 cleanrooms in the most critical
stages, with supporting processes running at ISO Class 6–7. This ensures
ultra-low contamination levels, allowing manufacturers to produce chips with
billions of transistors on nanometer scales.
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